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automotiveUnderstanding Test Methods for AutomobileControl and Communications SystemsSENSOR TESTINGTEMPERATURE MEASUREMENTENGINE CONTROL UNITSERIAL BUSEMI / EMCindex
previousnextIntroductionThe tremendous increase of electronic functions and controls and and the need to communicatevital information throughout the vehicle has increased the complexity of today’s vehicledesigns and the test processes needed to debug and verify these designs. This applications kitspecifically addresses these control and communication systems testing challenges for today’sautomobiles so you can learn how to resolve the challenges that are driving you.R&D DC Characterization of Sensors. 3Production Testing of Sensors. 4Testing MEMS Accelerometers for Cruise Control and Stability Control Systems. 5Testing Engine Control Units (ECUs). 6Simulating Sensor Signals. 7Signal Generators for Today’s Complex Signals. 8Multipoint Measurements in Automotive Test Applications. 9The Role of Switching Systems for Testing Cables, Connectors, and Insulators. 10Testing the Communication Buses in Automotive Designs.11Solutions for Testing Automotive Communication Protocols (Buses). 12Controlling Electromagnetic Interference (EMI) and Electromagnetic Compatibility (EMC). 13EMI/EMC Testing with Confidence. 14Mixed Domain Oscilloscope with a Built-In Spectrum Analyzer . 15Automotive Testing Solutions that Keep Pace with Emerging Technologies, Standards,and Requirements . 16Get advice for your application.Send us your question or join thediscussion in our application forum.2AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextSensor Development and CharacterizationMicro-Electro-Mechanical Systems (MEMS)are vital components of automotive electronicsystems, as modern vehicles rely on theseelectronic systems to make sure vehicles meetefficiency and security standards as well asenvironmental regulations.New technologies for electrical/electronic sensors offer numerous advantages in the design of detectionsystems to meet speed and ease of use criteria. With proper testing and calibration, sensors can meet thesecriteria while providing reliable results that minimize false positive and negative indications.Performance criteria for sensor systems include:n Sensitivity/resolution/accuracy/repeatabilityn Dynamic rangen Environmentally robust – tolerance to temperature, electrical noise, physical shock, vibration, etc.n Usable lifetime/adaptability/safety/integrityn Speed and ease of use (testing/calibration/maintenance)Automotive electronic control units require a wide variety of sensor applications. Automotive sensors are usedto measure temperature, pressure, flow, position, gas concentration, speed, brightness humidity, etc. Futuretrends in the automotive sensor technology are making sensors miniaturized, multi-functional, integrated, and intelligent.R&D DC Characterization of SensorsElectrical characterization of sensors involves comprehensive current-voltage (I-V) testing,requiring instruments such as digital multimeters (DMMs) and power sources. Quite often,Keithley’s source measure unit (SMU) instruments can provide a fully integrated, fourquadrant, all-in-one solution for I-V testing for sensors.n Source and measure voltage and current, with best-in-class low current resolutionn Precision current and voltage, sourcing and measurementn Source and load functionalityn Faster test time with high accuracy and repeatabilityn Avoid complex synchronization, interconnection, and programming issues caused byusing multiple instrumentsDownload the technical e-guide,Source Measure Units Instruments: The Toolof Choice for Emerging R&D ApplicationsBasic SMU TopologyGet advice for your application.Send us your question or join thediscussion in our application forum.3AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextProduction Testing of SensorsAutomotive sensor production testing requires the use of economic and flexible test equipment that has ahigh degree of automation, high speed, high performance, and high reliability. Sensor manufacturers need testsystems that can easily adapt to technologies in next-generation sensors, and they need test systems that canmaximize the effectiveness and life of their capital investment.Keithley SMU instruments are very suitable for the production and automated sensor testing applications thatneed high accuracy and sensitivity.Download the e-guide, How to Choose andApply Source Measure Unit Instrument.Download the New Materials and Devices e-guide.Get advice for your application.Send us your question or join thediscussion in our application forum.4AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextTesting MEMS Accelerometers for Cruise Control and Stability Control SystemsTesting MEMS wafers requires probing stations and test systems that are capable of making ultra-low levelmeasurements. Keithley is well known for more than 30 years of expertise in and commitment to parametrictest, and parametric test systems are designed to test new semiconductor wafers and MEMS devices thatwill be the core of new automotive sensors. Our S530 Parametric Test Systems are readily adaptable to newdevices and test requirements and offer capabilities that:n Minimize heat generation with low level sourcing and measurementnnnnMeasure resistive electrode elementsMeasure capacitance between vibrating elementsMeasure stray leakage currentsProvide excitation signals for functional testThe Keithley S530 Parametric Test System features:n Current measurements with 1fA resolution and current sourcing with 20fA resolutionn Voltage measurement with 1µV resolution and voltage sourcing with 5µV resolutionn Capacitance measurements down to 10pFn Probe card testing for up to 64 pinsLearn more about Keithley’sS530 SemiconductorParametric Test Systems.Get advice for your application.Send us your question or join thediscussion in our application forum.5AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextTesting Engine Control Units (ECUs)Automotive engines are electronically controlled by an onboard computer known as an ECU. An ECU computes information inreal time to determine optimum values for engine control parameters based on data relayed from sensors placed around thevehicle. Multiple control systems are used in contemporary automotive electronics systems, with as many as a 100 built intotop-of-the-line luxury vehicles. These systems are required to function in an extremely challenging environment. Malfunctionscannot be tolerated, as this could jeopardize passenger safety.Numerous inputs are needed to stimulate and test the performance of an ECU. Sensor signals can be simulated with DCvoltage levels. Signals from the camshaft and other types of sensors require AC voltage waveforms. Also, the ability for theECU to drive outputs such as lighting, solenoids, and motorized components must be validated; and, the ECU’s communicationprotocol performance must be verified.Operational conditions and requirements for ECUs have become increasingly stringent in recent years. Similarly, demand for theability to analyze higher frequencies has escalated, particularly with regard to noise immunity and transient signals capture.Noise spikes in the millisecond or microsecond, and, most recently, at the nanosecond level, need to be identified and acquired.However, because of the presence of extremelynoisy waveforms, analysis of high-frequency noisein the order of nanoseconds with conventionaloscilloscopes and probes had been problematic.Tektronix DPO7000 Series Oscilloscopes and TDP1000 High Voltage Differential Probes can be usedto successfully analyze nanosecond transient noisespikes in ECUs for engine control.Read the case studyDenso Selects Tektronix for Automotive Test SolutionLearn more about the DPO7000 Series OscilloscopesGet advice for your application.Send us your question or join thediscussion in our application forum.6AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextSimulating Sensor SignalsTo test automotive electronic control units, the units must receive simulated sensor signals.Various automotive sensor signals, such as pressure, temperature, speed, angle of rotationand displacement, simulation shaft, camshaft, wheels, locks, and other automotive enginesensor signals need to be recreated for functional testing and optimization of control unitsperformance.In its various configurations, the signal generator can provide stimulus signals in the formof basic analog waveforms, custom analog waveforms, digital data patterns, modulatedsignals, distorted signals, and noise. The signal generator can generate any waveformencountered in the automotive environment.Download the primer, XYZs of Signal Generators.Get advice for your application.Send us your question or join thediscussion in our application forum.7AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextThe World’s Fastest and Most Versatile Signal Generators for Today’s Complex SignalsTektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RFsignals and the fastest high speed serial data signals. Each versatile signal generator can create a virtuallyunlimited number of signals:n Analog or digitaln Ideal or distortedn Standard or customFrom the world’s only direct synthesis of high-speed serialdata waveforms for testing, to the world’s most versatilearbitrary function generator for common stimulus signals,Tektronix has a signal generator to overcome any automotivetest challenge.Learn more about Tektronixsignal generators.Get advice for your application.Send us your question or join thediscussion in our application forum.8AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextMultipoint Measurements in Automotive Test ApplicationsThere are many automotive systems tests that require only common instruments, such as load banks, high current power supplies, andDMMs. However, more specialized tests of conductors and insulators require instruments designed specifically for the measurementextremes involved in low resistance, high resistance, and low current testing. Complex devices, such as DC/DC converters, inverters,airbag igniter systems, and other electronic controllers require more extensive testing and multifaceted test systems.Automotive control units have a large number of inputs and outputs, and testing requires measurements at each of these inputsand outputs. Therefore, test systems that employ signal switching are essential for accurate, efficient, and fast testing of controlunits. In such a test system, the measuring instruments, signal switching, and other critical components should be selected forease of integration and optimum overall performance. Ideally, a fully-integrated data logging and switch system, such as Keithley’sSeries 2700 and Series 3706A Integrated Digital Multimeter/Switch/Data Logger Systems, eliminates the need to mix test systemcomponents and is perfect for so many automotive applications:n Monitoring temperature for air conditioning and heating elements of dashboardsn Automotive body control module testing for sensorsn Production/functional testing of signals from multiple sensors (MEMs) in ESPs and ABS systemsn Cable harness, wiring, connectors – low resistance testingDownload the e-guideHigh Performance DMMs for single- and multi-channel applicationsGet advice for your application.Send us your question or join thediscussion in our application forum.9AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextThe Role of Switching Systems for Testing Cables, Connectors, and InsulatorsContinuity Test SystemConductor 1Continuity TestingContinuity checks are performed on a variety of devices, including cable assemblies, printed circuit boards, andconnectors, to ensure that these components meet their specifications. When setting up a continuity test, themaximum resistance at which the device is considered to be valid must be specified. For example, any measuredresistance of 1Ω or less indicates a good device. Continuity checks require measuring low resistance, so afour-wire measurement technique used to eliminate lead and switch resistance errors and allow resistancemeasurements down to microΩ levels.Ch. 1Ch. 21Conductor 2Ch. 2Ch. 22Testing IR from any one terminal ofa multipin connector to all others.Conductor 20Ch. 20For testing multi-conductor devices, a switch system is useful for connecting the measurement instrument to eachconductor automatically.7111-S 40-Channel Form C Switch CardCh. 401HI SenseInsulation Resistance TestingAn isolation resistance or insulation resistance test is often performed in addition to the continuity test. DCinsulation resistance (IR) is the ratio of the DC voltage applied between two conductors separated by an insulatorto the total current flowing between the two conductors. The test voltage is applied for a specified period oftime before the resulting current is measured. The measured current is usually quite small, so a picoammeter orelectrometer is often required to make the measurement.LO SenseHI SourceOhmmeterLO SourceModel 2700/7702 Multimeter/Data Acquisition SystemTerminals 2of Multi-pinConnector40Ch. 1Ch. 2Ch. 40HI Output LOHI6517B Electrometer/SourcepAor6487 Picoammeter/Source LOThe insulation resistance of a DUT is measured to determine that it’s greater than a specifiedminimum value.An example of insulation resistance measurement would be the resistance between conductorsin a multi-conductor cable. IR measurements often involve multiple conductors, so a switchingsystem is often required to switch the picoammeter and the source to all the conductors inthe test circuit. The design and type of switching cards used in an IR test system depend onseveral factors, including the test voltage, magnitude of resistance, and accuracy.VoltageSourceDownload the e-guide High PerformanceSwitching ApplicationsGet advice for your application.Send us your question or join thediscussion in our application forum.10AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextTesting the Communication Buses in Automotive DesignsThe communication protocols that transmat and receive data between sensors, electronic control systems,and actuation devices must be highly resistant to EMI, have fast data transfer rates, and be low cost. Tohave a high noise tolerance, the communication protocols must have superior error detection algorithms.An automobile may use a number of different protocols for different applications; thus the se protocolsmust coexist in the harsh automotive environment. These protocols include CAN, LIN, MOST, and FlexRay.Debugging and testing these communication links is challenging and time consuming. Tools are neededto quickly and easily decode a transmission and time correlate the data with external events initiated bysensor signals. Tektronix oscilloscopes and logic analyzers provide all the necessary capabilities to decodeautomotive buses and provide protocol-level views of data sequences. Mixed signal oscilloscopes and logicanalyzers also provide innovative troubleshooting capabilities and comprehensive support for monitoring,triggering, and decoding the various automotive buses. Tektronix instruments ensure measurementconfidence and support for the most efficient debugging and testing of automotive links.Trace serial data flow between nodes through a networkn Simultaneously display messages at transmitter and receiver toverify continuity and propagation delaysOMFORT IESPGearBoxLeft ANMobile PhoneAir BagABSCarRadioSensorABSMOSTMulti NCANANSAFET YCANRight DoorTENCAN,LINEngineControlMTrace serial data flow between network segments separated by agatewayn Simultaneously display messages from multiple buses, atdifferent speeds, or even different bus standardsCDY/OBLINDiagnosticTISSSRADRIVEGet advice for your application.Send us your question or join thediscussion in our application forum.11AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextSuperior Solutions for Testing Automotive Communication Protocols (Buses)Tektronix oscilloscopes have power features for analyzing and verifying theperformance of automotive buses:n Advanced triggering modes that allow triggering on a wide range ofsignals and conditionsn Eye diagram and mask analysisn Simultaneously display messages at transmitter and receiver to verifycontinuity and propagation delaysn Multiple protocol analysis on one instrumentn Powerful search capabilities to isolate an anomalyTriggering on specific identifier andData on a CAN bus and decoding allmessages in the acquisition.Simultaneous capture and decode ofmultiple automotive serial buses.DPO4AUTOMAX Eye Diagramanalysis of a FlexRay signal.Learn how to solve embedded system design issues withexceptional efficiency. Download the application noteDebugging Serial Buses in Embedded System Designs.Get advice for your application.Send us your question or join thediscussion in our application forum.12AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextControlling Electromagnetic Interference (EMI) and Complying withElectromagnetic Compatibility (EMC) StandardsMeeting EMC standards and eliminating EMI in automotive systems requires designs that both minimizeemissions and can shield circuits from the increasing sources of noise in the automotive environment.The increase in noise sources is resulting from both integrated electronics and electronics devicesbrought into the automobile. Internal sources of intefering noise can originate from navigation systems,engine control systems, and wireless communication systems. External sources of noise brought intothe automobile can include mobile phones, tablet computers, electronic gaming devices, and radardetection devices.Infotainment systemsRemote entry devicesPortable Electronic DevicesBack-upradar / cameraNavigation, Bluetooth,Car Audio and RadioAdaptive Cruise ControlEMI/EMC test challenges include:n Performing tests required by national and international EMC standardsn Identifying the sources of noise that are interfering with system performanceo RF interferenceo Power transientso Electrostatic dischargeo Changing electric and magnetic fields from drivetrain power electronics and motorsn Capturing random eventsHV/EV Electronicdrive systemsElectronicengine controlsConvertor/InverterAlternatorAn infrequent transient is captured on a TektronixRSA series real time spectrum analyzer usingpatented DPX spectrum display technology. Thered areas are frequently-occurring signals, and theblue and green portions are transients.View the webinar:Practical Approach to EMI Diagnostics.Get advice for your application.Send us your question or join thediscussion in our application forum.13AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextEMI/EMC Testing with ConfidenceTektronix real time spectrum analyzers are unprecedented in their ability to identify thesource of EMI/EMC interference and to perform pre-compliance and compliance tests.Diagnostics and Debug Lo feed thru Detecting low-level signals in broad sweeps withnarrow resolution bandwidths Detecting and characterizing impulse noise Finding signals-within-signals Determining clock stability and settling to tuning,microphonics, and phase-hits Correlating transient emissions to hardware andsoftware statesPre-Compliance and Compliance Testing to standards and compliance levels withrequired filters and detectors Applying corrected measurements and limit linesReal-Time Spectrum Analyzers Discover elusive transient, impulse, and signal-within-signal events with 100% probabilitywith over 292,000/s spectrum updates and swept DPX Trigger and isolate spectrum events with 100% probability using patented DPX DensityTM,Frequency Mask, and Time-qualified Triggering, Frequency Edge, and cross-triggeroscilloscopes or logic analyzers within the event record Capture long event records with up to 110 MHz of bandwidth Analyze signals with MIL-STD and CISPR compliant filters and detectors Quickly assess compliance with corrected data and limit lines displayed Speed spur testing with the fastest scanning technology for wide spans and narrow resolutionbandwidthsRSA5000/6000 Series Real-Time Spectrum AnalyzersLearn more about the Tektronix familyof real-time spectrum analyzersGet advice for your application.Send us your question or join thediscussion in our application forum.14AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextMDO4000B Mixed Domain Oscilloscope -The First and Only Oscilloscope with a Built-in Spectrum AnalyzerThe award-winning MDO4000B provides features that enable you to quickly troubleshootEMI problems. Many EMI problems come from events rooted in the time domain, such asclocks, power supplies, and serial data links. The MDO4000B combines a spectrum analyzer,oscilloscope, and logic channels into a single instrument that enables you to measure therelationship between time-domain events and spectral emissions.Trigger on known EMI suspects (such as powersupplies, clocks, serial buses, etc.) to directly measureand correlate frequency and time domain events.Learn more about troubleshooting EMI issues.Watch the videoor download the application overviewGet advice for your application.Send us your question or join thediscussion in our application forum.15AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
previousnextAutomotive Testing Solutions that Keep Pace withEmerging Technologies, Standards, and RequirementsWith the increased complexity of today’s vehicle designs and their intricate electronic functions and embedded controls,it can be difficult to keep up with the standards and requirements for analyzing, debugging, and verifying these designs.Tektronix and Keithley have a collection of instruments and systems to specifically overcome even your most challenging testand measurement applications.Oscilloscopes with Combined Time Domain and Frequency Domain Analysis and Protocol AnalysisEight out of ten engineers around the world trust Tektronix to help them debug and test tomorrow’s designs faster. Withthe broadest portfolio of digital oscilloscopes available, the richest set of product features, the most extensive analysiscapability, and our award-winning service and support, Tektronix has the right oscilloscope to meet your automotive systemtest requirements. Learn more.Switching Mainframes with up to 576 Channels and a High Speed 7.5-Digit DMMThe Model 3706A is a scalable, instrument grade switching and multi-channel measurement solution that is optimized forautomated testing of electronic systems. A mainframe can support up to 576 two-wire multiplexer channels for unrivaleddensity and economical per channel costs; the high performance multimeter provides a tightly integrated switch andmeasurement system. Learn more.Multiple-channel Arbitrary Waveform GeneratorsProviding leading-edge performance with sample rates to 50GS/s or lower sample rate solutions on up to four channels,Tektronix arbitrary waveform generators enable complex signal generation to seamlessly move from a simulationenvironment to the real world. Learn more.Specialized Power Sourcing for a Wide Range of DC and Battery-simulating WaveformsKeithley DC power supplies and source measure unit (SMU) instruments can supply precision voltage levels and specificwaveforms to power control systems and simulate automotive test waveforms.Learn more about TektronixAC instruments and systems.Learn more about Keithley’sDC instruments and systems.Automated Component Test SystemsTest semiconductors and MEMS at the device or wafer level with flexible and customizable Keithley parametric test systems.Unprecedented Real-Time Spectrum AnalysisTektronix real time spectrum analyzers enable you to identify the EMI/EMC interference source and perform pre-complianceand compliance testing with confidence.Get advice for your application.Send us your question or join thediscussion in our application forum.16AU T O M O T I V E U N D E R S TA N D I N G T E S T I N G A P P L I C AT I O N S F O R A U T O M O B I L E C O N T R O L S Y S T E M S A N D C O M M U N I C AT I O N S .index
Tektronix and Keithley maintain a comprehensive, constantly-expanding collection of application notes, technical briefs, and other resources to helpengineers stay on the cutting edge of technology. For further information, please visit www.tektronix.com or www.keithley.com.Copyright Tektronix, Inc. All rights reserved. Tektronix and Keithley products are covered by U.S. and foreign patents, issued and pending.Information in this publication supersedes that in all previously published material. Specification and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of Tektronix,Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks of their respective companies.17 March 2014 Control and Communications Systems 3257
Series 2700 and Series 3706A Integrated Digital Multimeter/Switch/Data Logger Systems, eliminates the need to mix test system components and is perfect for so many automotive applications: n Monitoring temperature for air conditioning and heating elements of dashboards n Automotive
